Thriving on the most complex challenges, our experienced multi- disciplinary teams work closely with our customers to identify their needs, before innovating to create breakthrough metrology solutions. Nova’s solutions enable advanced inline control of critical properties throughout the semiconductor process lifecycle. Nova’s holistic approach combines robust high-precision hardware with the finest physical and mathematical software solutions, which interlace machine learning and big data capabilities. Our unique portfolio allows our customers to gain deeper insights while increasing yields and shortening time to market.